Scanning electron microscopy (SEM) is a powerful and versatile tool for material characterization. This is particularly so in recent years, due to the continuous downsizing of the materials used in various applications. Images generated with SEM provide topographical, morphological and compositional information about the sample. The data obtained are invaluable in a variety of science and industry applications.

Our scanning electron microscope allows to view surface features at 5 to 50,000x magnification to provide you with high quality, depth of field images. When used with EDX detector, the elemental composition of surface is quickly attained.

We offer:

  • High magnification imaging
  • Analysis of metals, minerals and fabrics
  • Qualitative and quantitative chemical analysis of the surface by EDX.

We operate with Philips XL30 ESEM Microscope equipped with:

  • SE and BSE detectors
  • EDX detector
  • ESEM mode